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Ho Jun Oh

affiliation not provided to SSRN

  • affiliation not provided to SSRN

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Structural and Electrical Transitions in Vo₂/C-Al₂O₃ Films Investigated Using Simultaneous X-Ray Reciprocal Space Mapping and Electrical Resistance Measurements

Number of pages: 26 Posted: 04 May 2025
Ho Jun Oh, Sung Soo Ha, In Hwa Cho, Youngmin Yun, Seonghyun Han, Jin-Woo Kim, Su Yong Lee, Hyon Chol Kang and Do Young Noh
affiliation not provided to SSRN, affiliation not provided to SSRN, Pusan National University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Pohang University of Science and Technology (POSTECH) - Pohang Accelerator Laboratory, Chosun University and affiliation not provided to SSRN
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VO2 thin films, Metal-insulator transition, Structural phase transition, Reciprocal space map, Correlation length