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Miguel L. Crespillo

Universidad Autónoma de Madrid - Center for Micro Analysis of Materials (CMAM)

SCHOLARLY PAPERS

3

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151

TOTAL CITATIONS

1

Scholarly Papers (3)

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1.

Unveiling the Radiation-Induced Defect Production and Damage Evolution in Tungsten with Multi-Energy Rutherford Backscattering Spectroscopy in Channeling Configuration

Number of pages: 24 Posted: 05 Jul 2023
Sabina Markelj, Xin Jin, Flyura Djurabekova, Janez Zavašnik, Esther Punzón-Quijorna, Thomas Schwarz-Selinger, Miguel L. Crespillo, Gaston García López, Fredric Granberg, Kai Nordlund, Andreja Šestan and Mitja Kelemen
Jozef Stefan Institute, University of Helsinki - Department of Physics, University of Helsinki - Division of Materials Physics, Jozef Stefan Institute, Jozef Stefan Institute, Max-Planck-Institut für Plasmaphysik, Universidad Autónoma de Madrid - Center for Micro Analysis of Materials (CMAM), Universidad Autónoma de Madrid - Center for Micro Analysis of Materials (CMAM), University of Helsinki - Department of Physics, University of Helsinki - Division of Materials Physics, Jozef Stefan Institute and Jozef Stefan Institute
Downloads 71 (867,774)
Citation 1

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Tungsten, defects, C-RBS, displacement damage, molecular dynamic simulations, TEM

2.

Li-Loss Mechanisms in Licoo2 Cathodes Prepared by Physical Vapor Deposition

Number of pages: 29 Posted: 25 Mar 2024
María Jesús Ramirez-Peral, Jesús Díaz-Sánchez, Arturo Galindo Sanz, Miguel L. Crespillo, Herko P. van der Meulen, Carmen Morant, Celia Polop and Enrique Vasco
affiliation not provided to SSRN, Universidad Autónoma de Madrid, affiliation not provided to SSRN, Universidad Autónoma de Madrid - Center for Micro Analysis of Materials (CMAM), Universidad Autónoma de Madrid, Universidad Autónoma de Madrid, Universidad Autónoma de Madrid and affiliation not provided to SSRN
Downloads 42 (1,157,785)

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Thin film cathodes, Li stoichiometry, zero-strain cathodes, solid-state Li-ion battery, energy materials

3.

Concentric Core-Shell Tracks and Spectroscopic Properties of Srtio3 Under Intense Electronic Excitation

Number of pages: 26 Posted: 08 Jul 2022
Xinqing Han, Eva Zarkadoula, Qing Huang, Miguel L. Crespillo, Xuelin Wang and Peng Liu
Shandong University, Government of the United States of America - Oak Ridge National Laboratory, affiliation not provided to SSRN, Universidad Autónoma de Madrid - Center for Micro Analysis of Materials (CMAM), Shandong University and Shandong University
Downloads 38 (1,209,354)

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electronic energy loss, track fine structure, molecular dynamics simulation, hillock nanostructure, spectroscopic properties