IEEE Senior Member
Light point defects (LPD), Edge site frontsurface-referenced least squares/range (ESFQR), Process-induced defects, Z-height double derivative (ZDD).
Microelectromechanical systems (MEMS), Ni-Mn-Ga, hybrid device, actuator, ferromagnetic shape memory, MSM
Smart materials, Micro-Magneto-mechanical systems (MAMS), Microelectromechanical systems (MEMS), Magnetic shape memory (MSM), Ni-Mn-Ga alloy
Autonomous manufacturing, semiconductor manufacturing, physicsinformed AI, digital twins, Industry 5.0, intelligent manufacturing, scientific machine learning, semiconductor AI, Fab process innovation, AI adoption