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Wooho Ham

Yonsei University

Seoul

Korea, Republic of (South Korea)

  • Yonsei University

SCHOLARLY PAPERS

4

DOWNLOADS

270

TOTAL CITATIONS

0

Scholarly Papers (4)

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1.

Doping Modulated Ion Hopping in Tantalum Oxide Based Resistive Switching Memory for Linear and Stable Switching Dynamics

Number of pages: 10 Posted: 06 Feb 2023
Young-Woong Song, Yun Hee Chang, Jaeho Choi, Min-Kyu Song, Jeong Hyun Yoon, Sein Lee, Se-Yeon Jung, Wooho Ham, Jeong-Min Park, Hyun-Suk Kim and Jang-Yeon Kwon
Yonsei University, Chungnam National University, affiliation not provided to SSRN, Massachusetts Institute of Technology (MIT), Yonsei University, Yonsei University, Yonsei University, Yonsei University, Yonsei University, Chungnam National University and Yonsei University
Downloads 81 (803,225)

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resistive switching memorymemristordopingnanoionicsnanoelectronicsDFT simulation

2.

Control Of Hydrogen Concentration of Ingazno Thin Film Using Cryopumping System

Number of pages: 11 Posted: 23 Jun 2023
Jeong-Min Park, Se-Yeon Jung, Sein Lee, Young-Woong Song, Junseo Lee, Jeong Hyun Yoon, Wooho Ham and Jang-Yeon Kwon
Yonsei University, Yonsei University, Yonsei University, Yonsei University, Yonsei University, Yonsei University, Yonsei University and Yonsei University
Downloads 78 (816,709)

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Hydrogen concentration, Cryo-pump, Thin film transistor, InGaZnO, Stress stability

3.

High-Performance Short-Channel Self-Aligned Top-Gate InSnZnO TFTs with a Stacked Al2O3/SiO2 Gate Dielectric: Elucidating the Enhancement Mechanisms

Number of pages: 42 Posted: 22 Dec 2025
Dongwook Shin, Sein Lee, Jeong-Min Park, Junseo Lee, Wooho Ham, Sohyung Lee, Byung-Du Ahn, Dae Hwan Kim, Jong-Uk Bae, YoungSeok Choi and Jang-Yeon Kwon
Yonsei University, Yonsei University, Yonsei University, Yonsei University, Yonsei University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Yonsei University
Downloads 59 (970,490)

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short channel, self-aligned top-gate thin-film transistor, oxide semiconductor, Indium tin zinc oxide (ITZO), heterostacked Al2O3/SiO2 gate insulator (GI), interface defect passivation

4.

In-Situ Dehydrogenation Impact on Amorphous Ingazno Thin-Film Transistors

Number of pages: 27 Posted: 18 Mar 2025
Junseo Lee, Sein Lee, Jeong-Min Park, Wooho Ham, Jeong Hyun Yoon, Seok Daniel Namgung and Jang-Yeon Kwon
Yonsei University, Yonsei University, Yonsei University, Yonsei University, Yonsei University, Chung-Ang University and Yonsei University
Downloads 52 (1,041,696)

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Thin-film transistor, oxide semiconductor, a-IGZO, dehydrogenation, Hydrogen, sputtering power