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Janusz D. Fidelus

Central Office of Measures

SCHOLARLY PAPERS

3

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146

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Scholarly Papers (3)

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1.

Atomic Force Microscopy in Mechanical Measurements of Single Nanowires

Downloads 84 (777,583)

Atomic Force Microscopy in Mechanical Measurements of Single Nanowires

Number of pages: 16 Posted: 09 Jun 2023
Bartosz C. Pruchnik, Janusz D. Fidelus, Ewelina Gacka, Krystyna Mika, Leszek Zaraska, Grzegorz D. Sulka and Teodor P. Gotszalk
Wrocław University of Science and Technology, Central Office of Measures, Wrocław University of Science and Technology, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Wrocław University of Science and Technology
Downloads 50 (1,083,731)

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AFM, nanowires, nanomechanics, nanomanipulation, ZnO

Atomic Force Microscopy in Mechanical Measurements of Single Nanowires

Number of pages: 17 Posted: 31 Oct 2023
Bartosz C. Pruchnik, Janusz D. Fidelus, Ewelina Gacka, Krystyna Mika, Leszek Zaraska, Grzegorz D. Sulka and Teodor P. Gotszalk
Wrocław University of Science and Technology, Central Office of Measures, Wrocław University of Science and Technology, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Wrocław University of Science and Technology
Downloads 34 (1,296,409)

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AFM, nanowires, nanomechanics, nanomanipulation, ZnO

2.

Relationship between the Structural Properties of Zno Nanowires and Their Modulus of Elasticity

Number of pages: 15 Posted: 19 Feb 2023
Bartosz C. Pruchnik, Janusz D. Fidelus, Ewelina Gacka, Krystyna Mika, Leszek Zaraska, Grzegorz D. Sulka and Teodor P. Gotszalk
Wrocław University of Science and Technology, Central Office of Measures, Wrocław University of Science and Technology, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Wrocław University of Science and Technology
Downloads 46 (1,109,210)

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AFM, nanowires, nanomechanics, nanomanipulation, ZnO

3.

Fabrication and Metrological Validation of a Candidate AFM Calibration Standard Based on Silicon Nanostructures

Number of pages: 10 Posted: 05 Jun 2026
Aldona Kubala-Kukuś, Dariusz Banaś, Dariusz Czułek, Krzysztof Domański, Janusz D. Fidelus, Marta Goliszek-Chabros, Paweł Jagodziński, Paweł Janus, Magdalena Kucharska, Urszula Maciołek, Aldona Nowicka, Piotr Prokaryn, Andrzej Sierakowski, Krzysztof Skrzypiec, Weronika Sofinska-Chmiel, Ilona Stabrawa and Karol Szary
affiliation not provided to SSRN, affiliation not provided to SSRN, Central Office of Measures, affiliation not provided to SSRN, Central Office of Measures, Maria Curie-Sklodowska University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Maria Curie-Sklodowska University, Maria Curie-Sklodowska University, affiliation not provided to SSRN, affiliation not provided to SSRN, Maria Curie-Sklodowska University, Maria Curie-Sklodowska University, affiliation not provided to SSRN and affiliation not provided to SSRN
Downloads 16

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atomic force microscopy, calibration standards, electron beam lithography, projection photolithography, surface microstructure mapping, scanning electron microscopy