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Kosuke Murakami

The University of Osaka

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Scholarly Papers (1)

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Influence of Impurities on Molten KOH-NaOH Etching Revealed by Comparative Analysis of Dislocations in GaN Substrates Grown by Different Methods

Number of pages: 21 Posted: 17 Dec 2025
Bhavpreeta Pratap Charan, Masayuki Imanishi, Kosuke Murakami, Shigeyoshi Usami, Mihoko Maruyama, Masashi Yoshimura, Verdad C. Agulto, Makoto Nakajima, Toshiyuki Iwamoto and Yusuke Mori
The University of Osaka, The University of Osaka, The University of Osaka, The University of Osaka, The University of Osaka, The University of Osaka, The University of Osaka, The University of Osaka, affiliation not provided to SSRN and The University of Osaka
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Abstract:

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A1. Characterization, A1. Etching, A1. Line Defects, A2. Sodium Flux Growth method, B1. Nitrides, B1. GaN