A1. Characterization, A1. Etching, A1. Line Defects, A2. Sodium Flux Growth method, B1. Nitrides, B1. GaN
X-ray diffraction (XRD), Unsupervised machine learning, crystal, microstructure, GaN
A1. Thermal conductivityA1. First-principles calculation \sepA1. Point defects \sepB2. Semiconducting III-V materials