Parastesh Pirasteh

Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France

SCHOLARLY PAPERS

4

DOWNLOADS

99

TOTAL CITATIONS

0

Scholarly Papers (4)

1.

Porous Silicon Decorated with Copper Particles for Bimodal Detection of Dimethylmethylphosphonate by Ft-Ir and Mass Spectrometry

Number of pages: 12 Posted: 28 Apr 2023
Ecole Centrale d'Electronique (ECE), Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France, Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France, University of Lille, Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France and Ecole Centrale d'Electronique (ECE)
Downloads 40 (938,527)

Abstract:

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Porous Silicon, dimethylmethylphosphonate, copper particles, FT-IR, Mass spectrometry, bimodal detection

2.

FT-IR Detection of Dmmp on TiO 2-Modified Porous Silicon Substrates

Number of pages: 17 Posted: 18 Jun 2024
Ecole Centrale d'Electronique (ECE), Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France, Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France, University of Lille, Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France and Ecole Centrale d'Electronique (ECE)
Downloads 27 (1,076,847)

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Porous silicon, dimethyl methyl phosphonate, Titanium oxide, FT-IR, Gas sensor

3.

Porous Silicon Decorated with Copper Particles for Dual Detection of Dimethyl Methylphosphonate by Ft-Ir Spectroscopy and Mass Spectrometry

Number of pages: 14 Posted: 22 Apr 2024
Ecole Centrale d'Electronique (ECE), Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France, Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France, University of Lille, Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France and Ecole Centrale d'Electronique (ECE)
Downloads 21 (1,150,168)

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porous silicon, copper particles, FT-IR, Mass spectrometry, DMMP

4.

Copper-Decorated Porous Silicon for the Bimodal Detection of Dmmp, a Sarin Simulant, by Ft-Ir Spectroscopy and Matrix-Free Laser Desorption Mass Spectrometry

Number of pages: 10 Posted: 07 Mar 2025
Ecole Centrale d'Electronique (ECE), Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France, Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France, University of Lille, Univ Rennes, CNRS, CREM - UMR6211, F-35000 Rennes France and Ecole Centrale d'Electronique (ECE)
Downloads 11 (1,268,272)

Abstract:

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Porous silicon, DMMP, FT-IR spectroscopy, Matrix-free LDI mass spectrometry, Copper particles