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Narayanan Madaboosi

affiliation not provided to SSRN

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Scholarly Papers (1)

1.

High Precision Correlative Analysis of Dielectric Behavior Evolution and Anisotropy in Graphene Oxide Thin Film as a Function of Thermal Annealing Parameters

Number of pages: 35 Posted: 11 Dec 2024
RWTH Aachen University, RWTH Aachen University, RWTH Aachen University, RWTH Aachen University, RWTH Aachen University, RWTH Aachen University, Free University of Berlin, Helmholtz Association of German Research Centres - BAM Federal Institute for Materials Research and Testing, Helmholtz Association of German Research Centres - BAM Federal Institute for Materials Research and Testing, RWTH Aachen University, affiliation not provided to SSRN, RWTH Aachen University, RWTH Aachen University, Lorestan University and RWTH Aachen University
Downloads 57 (1,000,027)

Abstract:

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Thermal annealing, Reduced graphene oxide, Thin Films, 2D Materials, Dielectric spectroscopy, Spectroscopic Ellipsometry