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Joerg Manfred Stockmann

Helmholtz Association of German Research Centres - BAM Federal Institute for Materials Research and Testing

Berlin Office

Anna-Louisa-Karsch-Straße 2

Berlin, DE 10178

Germany

SCHOLARLY PAPERS

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Scholarly Papers (1)

1.

High Precision Correlative Analysis of Dielectric Behavior Evolution and Anisotropy in Graphene Oxide Thin Film as a Function of Thermal Annealing Parameters

Number of pages: 35 Posted: 11 Dec 2024
RWTH Aachen University, RWTH Aachen University, RWTH Aachen University, RWTH Aachen University, RWTH Aachen University, RWTH Aachen University, Free University of Berlin, Helmholtz Association of German Research Centres - BAM Federal Institute for Materials Research and Testing, Helmholtz Association of German Research Centres - BAM Federal Institute for Materials Research and Testing, RWTH Aachen University, affiliation not provided to SSRN, RWTH Aachen University, RWTH Aachen University, Lorestan University and RWTH Aachen University
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Abstract:

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Thermal annealing, Reduced graphene oxide, Thin Films, 2D Materials, Dielectric spectroscopy, Spectroscopic Ellipsometry