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Soo-Hong Jeong

Chungbuk National University

Chungbuk 361-763

Korea, Republic of (South Korea)

  • Chungbuk National University

SCHOLARLY PAPERS

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Scholarly Papers (1)

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1.

Designing Buried-Gate Ingazno Transistors for High-Yield and Reliable Switching Characteristics

Number of pages: 23 Posted: 21 Nov 2023
Do Hyeong Kim, Seyoung Oh, Ojun Kwon, Soo-Hong Jeong, Hyun Young Seo, Eunjeong Cho, Min Jeong Kim, Wondeok Seo, Jung-Dae Kwon, Yonghun Kim, Woojin Park and Byungjin Cho
Chungbuk National University, Chungbuk National University, Chungbuk National University, Chungbuk National University, Chungbuk National University, Chungbuk National University, Chungbuk National University, Chungbuk National University, Korea Institute of Materials Science, Korea Institute of Materials Science, Chungbuk National University and Chungbuk National University
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Citation 2

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IGZO field effect transistor, buried type gate structure, enhanced electrical parameters, high yield, high bias-stress stability