Atlanta, GA 30332
United States
Georgia Institute of Technology
in situ electron microscopy, Grain boundary migration, Dislocations
In situ electron microscopy, Grain boundary migration, Dislocations
Gradient dislocation structure, Steel, Fatigue resistance, strain localization, Stacking fault
Gradient nanotwinned Cu, Strain gradient plasticity modeling, Representative volume element, Extra strength, Back stress
grain growth, Texture evolution, Plasticity, Thin film, STEM
ultrafine grained thin films, grain boundary migration, in situ TEM, yield stress