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Kunqing Ding

Georgia Institute of Technology

Atlanta, GA 30332

United States

SCHOLARLY PAPERS

3

DOWNLOADS

237

TOTAL CITATIONS

0

Scholarly Papers (3)

Grain Size Effects on Stress-Assisted Grain Boundary Migration in Polycrystalline AU Thin Films Under Tension

Number of pages: 37 Posted: 07 May 2024
Georgia Institute of Technology, Georgia Institute of Technology, Georgia Institute of Technology, Georgia Institute of Technology and Georgia Institute of Technology - School of Materials Science and Engineering
Downloads 84 (785,882)

Abstract:

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in situ electron microscopy, Grain boundary migration, Dislocations

Grain Size Effects on Stress-Assisted Grain Boundary Migration in Polycrystalline Au Thin Films Under Tension

Number of pages: 38 Posted: 24 Mar 2025
Georgia Institute of Technology, Georgia Institute of Technology, Georgia Institute of Technology, Georgia Institute of Technology and Georgia Institute of Technology - School of Materials Science and Engineering
Downloads 41 (1,196,631)

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In situ electron microscopy, Grain boundary migration, Dislocations

2.

Enhanced High-Cycle Fatigue Resistance of Gradient Structured 304 Stainless Steel

Number of pages: 24 Posted: 28 May 2025
Chinese Academy of Sciences (CAS) - Institute of Metal Research, Chinese Academy of Sciences (CAS) - Institute of Metal Research, Georgia Institute of Technology, Georgia Institute of Technology, Chinese Academy of Sciences (CAS) - Institute of Metal Research and Chinese Academy of Sciences (CAS) - Institute of Metal Research
Downloads 72 (860,052)

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Gradient dislocation structure, Steel, Fatigue resistance, strain localization, Stacking fault

3.

The Role of Grain Size Distribution on the Anomalous Yielding of Ultrafine-grained Au Thin Films​

Number of pages: 19 Posted: 03 Nov 2025
Georgia Institute of Technology, Georgia Institute of Technology, Georgia Institute of Technology, Georgia Institute of Technology - School of Materials Science and Engineering and Georgia Institute of Technology
Downloads 40 (1,183,237)

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ultrafine grained thin films, grain boundary migration, in situ TEM, yield stress