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Dongseok Kwon

Seoul National University

Kwanak-gu

Seoul, 151-742

Korea, Republic of (South Korea)

  • Seoul National University

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Scholarly Papers (1)

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Stochasticity in Ferroelectric Memory Devices with Different Bottom Electrode Crystallinity

Number of pages: 10 Posted: 19 Jan 2024
Ryun-Han Koo, Wonjun Shin, Gyuweon Jung, Dongseok Kwon, Jae-Joon Kim, Daewoong Kwon and Jong-Ho Lee
Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Hanyang University and Seoul National University
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Abstract:

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Low-frequency noise (LFN), Stochastic read noise, Current fluctuation, Transient response, Ferroelectric tunnel junction (FTJ), Hafnium zirconium oxide (HfZrO2)