Kwanak-gu
Seoul, 151-742
Korea, Republic of (South Korea)
Seoul National University
Stochasticity, Ferroelectric tunnel junction, Low-frequency noise (LFN), 1/f noise, Trap formation, Plasma-induced damage
ferroelectric thin-film transistors, indium-gallium-zinc oxide channel, compute-in-memory, neuromorphic, vision transformer
Stochasticity, Ferroelectric, Low-frequency noise (LFN), Trap Generation, Interface Percolation
Ising machine, V-NAND flash memory, Combinatorial optimization problem, Hopfield neural network
Low-frequency noise (LFN), Stochastic read noise, Current fluctuation, Transient response, Ferroelectric tunnel junction (FTJ), Hafnium zirconium oxide (HfZrO2)
ferroelectric field-effect transistor, ferroelectric HZO, interface dipole modulation, neuromorphic computing
Low-frequency noise (LFN), Read noise, Current fluctuation, Ferroelectric, Hafnium zirconium oxide (HZO)
Vision Transformer, Attention score, Self-attention, V-NAND flash memory, Neuromorphic Computing
Random telegraph noise (RTN), Lorentzian noise, Low-frequency noise (LFN), Ferroelectric, Neuromorphic system
FET-type gas sensor, self-curing method, parasitic bipolar junction transistor, reliability