Seoul
Korea, Republic of (South Korea)
Hongik University
Stochasticity, Ferroelectric tunnel junction, Low-frequency noise (LFN), 1/f noise, Trap formation, Plasma-induced damage
Stochasticity, Ferroelectric, Low-frequency noise (LFN), Trap Generation, Interface Percolation
Low-frequency noise (LFN), Read noise, Current fluctuation, Ferroelectric, Hafnium zirconium oxide (HZO)
Random telegraph noise (RTN), Lorentzian noise, Low-frequency noise (LFN), Ferroelectric, Neuromorphic system
Steep switching device, memory device, Neuron device, Deep spiking neural networks, Rate coding