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Sung-Tae Lee

Hongik University

Seoul

Korea, Republic of (South Korea)

SCHOLARLY PAPERS

5

DOWNLOADS

398

TOTAL CITATIONS

2

Scholarly Papers (5)

1.

Physical Correlation between Stochasticity and Process-Induced Damage in Ferroelectric Memory Devices

Number of pages: 13 Posted: 05 Feb 2025
Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Hongik University, Hanyang University and Seoul National University
Downloads 114 (621,896)

Abstract:

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Stochasticity, Ferroelectric tunnel junction, Low-frequency noise (LFN), 1/f noise, Trap formation, Plasma-induced damage

2.

Interface Percolation and Random Trap Generation in Ferroelectric Memory: A Two-Step Degradation Mechanism Explored Through Low-Frequency Noise Spectroscopy

Number of pages: 11 Posted: 27 Feb 2025
Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Hongik University, affiliation not provided to SSRN and affiliation not provided to SSRN
Downloads 109 (645,052)

Abstract:

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Stochasticity, Ferroelectric, Low-frequency noise (LFN), Trap Generation, Interface Percolation

3.

A Universal Re-Annealing Method for Enhancing Endurance in Hafnia Ferroelectric Memories: Insights from Stochastic Noise Analysis

Number of pages: 22 Posted: 12 Apr 2025
Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Sogang University, Seoul National University, Seoul National University, Seoul National University, affiliation not provided to SSRN, Seoul National University, Seoul National University, Hongik University, affiliation not provided to SSRN and Seoul National University
Downloads 73 (860,052)

Abstract:

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Low-frequency noise (LFN), Read noise, Current fluctuation, Ferroelectric, Hafnium zirconium oxide (HZO)

4.

Chaotic Behavior of Random Telegraph Noise in Ferroelectric Devices: Impact of Downscaling and Mitigation Strategies for Neuromorphic Applications

Number of pages: 12 Posted: 08 Aug 2024
Seoul National University, Seoul National University, Hongik University, Hanyang University and Seoul National University
Downloads 66 (907,769)
Citation 2

Abstract:

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Random telegraph noise (RTN), Lorentzian noise, Low-frequency noise (LFN), Ferroelectric, Neuromorphic system

5.

Deep Spiking Neural Networks with Integrate and Fire Neuron Using Steep Switching Device

Number of pages: 10 Posted: 03 Aug 2023
Sung Yun Woo, Sangyeon Pak and Sung-Tae Lee
Kyungpook National University, Hongik University and Hongik University
Downloads 36 (1,263,436)

Abstract:

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Steep switching device, memory device, Neuron device, Deep spiking neural networks, Rate coding