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Jangsang Kim

Seoul National University

Kwanak-gu

Seoul, 151-742

Korea, Republic of (South Korea)

SCHOLARLY PAPERS

3

DOWNLOADS

337

TOTAL CITATIONS

0

Scholarly Papers (3)

1.

Physical Correlation between Stochasticity and Process-Induced Damage in Ferroelectric Memory Devices

Number of pages: 13 Posted: 05 Feb 2025
Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Hongik University, Hanyang University and Seoul National University
Downloads 114 (621,896)

Abstract:

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Stochasticity, Ferroelectric tunnel junction, Low-frequency noise (LFN), 1/f noise, Trap formation, Plasma-induced damage

2.

Hafnia-Based Ferroelectric Computer Vision System with Artificial Synaptic Array

Number of pages: 39 Posted: 20 Jan 2025
Hanyang University, Seoul National University, Seoul National University, Inha University, Hanyang University, Hanyang University, Seoul National University, Seoul National University and Hanyang University
Downloads 114 (630,858)

Abstract:

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ferroelectric thin-film transistors, indium-gallium-zinc oxide channel, compute-in-memory, neuromorphic, vision transformer

3.

Interface Percolation and Random Trap Generation in Ferroelectric Memory: A Two-Step Degradation Mechanism Explored Through Low-Frequency Noise Spectroscopy

Number of pages: 11 Posted: 27 Feb 2025
Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Hongik University, affiliation not provided to SSRN and affiliation not provided to SSRN
Downloads 109 (645,052)

Abstract:

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Stochasticity, Ferroelectric, Low-frequency noise (LFN), Trap Generation, Interface Percolation