Kwanak-gu
Seoul, 151-742
Korea, Republic of (South Korea)
Seoul National University
Stochasticity, Ferroelectric tunnel junction, Low-frequency noise (LFN), 1/f noise, Trap formation, Plasma-induced damage
ferroelectric thin-film transistors, indium-gallium-zinc oxide channel, compute-in-memory, neuromorphic, vision transformer
Stochasticity, Ferroelectric, Low-frequency noise (LFN), Trap Generation, Interface Percolation