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Seungwhan Kim

Seoul National University

Kwanak-gu

Seoul, 151-742

Korea, Republic of (South Korea)

  • Seoul National University

SCHOLARLY PAPERS

3

DOWNLOADS

296

TOTAL CITATIONS

0

Scholarly Papers (3)

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1.

Physical Correlation between Stochasticity and Process-Induced Damage in Ferroelectric Memory Devices

Number of pages: 13 Posted: 05 Feb 2025
Ryun-Han Koo, Seungwhan Kim, Gyuweon Jung, Kangwook Choi, Sangwoo Ryu, Jangsang Kim, Jiseong Im, Sung-Ho Park, Jonghyun Ko, Sung-Tae Lee, Daewoong Kwon and Wonjun Shin
Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Hongik University, Hanyang University and Seoul National University
Downloads 114 (621,896)

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Stochasticity, Ferroelectric tunnel junction, Low-frequency noise (LFN), 1/f noise, Trap formation, Plasma-induced damage

2.

Interface Percolation and Random Trap Generation in Ferroelectric Memory: A Two-Step Degradation Mechanism Explored Through Low-Frequency Noise Spectroscopy

Number of pages: 11 Posted: 27 Feb 2025
Ryun-Han Koo, Wonjun Shin, Seungwhan Kim, Sangwoo Ryu, Gyuweon Jung, Jangsang Kim, Jiseong Im, Sung-Ho Park, Kangwook Choi, Jonghyun Ko, Sung-Tae Lee, Daewoong Kwon and Jong-Ho Lee
Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Hongik University, affiliation not provided to SSRN and affiliation not provided to SSRN
Downloads 109 (645,052)

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Stochasticity, Ferroelectric, Low-frequency noise (LFN), Trap Generation, Interface Percolation

3.

A Universal Re-Annealing Method for Enhancing Endurance in Hafnia Ferroelectric Memories: Insights from Stochastic Noise Analysis

Number of pages: 22 Posted: 12 Apr 2025
Ryun-Han Koo, Wonjun Shin, Jiseong Im, Sangwoo Ryu, Seungwhan Kim, Jangsaeng Kim, Kangwook Choi, Sung-Ho Park, Jonghyun Ko, Jongho Ji, Mingyun Oh, Gyuweon Jung, Sung-Tae Lee, Daewoong Kwon and Jong-Ho Lee
Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Sogang University, Seoul National University, Seoul National University, Seoul National University, affiliation not provided to SSRN, Seoul National University, Seoul National University, Hongik University, affiliation not provided to SSRN and Seoul National University
Downloads 73 (860,052)

Abstract:

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Low-frequency noise (LFN), Read noise, Current fluctuation, Ferroelectric, Hafnium zirconium oxide (HZO)