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Jong-Ho Lee
Affiliation not provided to SSRN
SCHOLARLY PAPERS
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Scholarly Papers (1)
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1.
Interface Percolation and Random Trap Generation in Ferroelectric Memory: A Two-Step Degradation Mechanism Explored Through Low-Frequency Noise Spectroscopy
Number of pages: 11
Posted: 27 Feb 2025
Ryun-Han Koo
,
Wonjun Shin
,
Seungwhan Kim
,
Sangwoo Ryu
,
Gyuweon Jung
,
Jangsang Kim
,
Jiseong Im
,
Sung-Ho Park
,
Kangwook Choi
,
Jonghyun Ko
,
Sung-Tae Lee
,
Daewoong Kwon
and Jong-Ho Lee
Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Seoul National University, Hongik University,
affiliation not provided to SSRN
and
affiliation not provided to SSRN
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Abstract:
Stochasticity, Ferroelectric, Low-frequency noise (LFN), Trap Generation, Interface Percolation
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