Yo Seop Ji

affiliation not provided to SSRN

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Effect of Source/Drain Electrode Materials on the Electrical Performance and Stability of Amorphous Indium-Tin-Zinc-Oxide Fets

Number of pages: 17 Posted: 16 Apr 2024
Seong Ui An, Dae-Hwan Ahn, Gijun Ju, Simin Chen, Yo Seop Ji, Jae-Hoon Han, Jaekyun Kim and Younghyun Kim
Hanyang University, affiliation not provided to SSRN, affiliation not provided to SSRN, Hanyang University, affiliation not provided to SSRN, affiliation not provided to SSRN, Hanyang University and affiliation not provided to SSRN
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Abstract:

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amorphous indium-tin-zinc-oxide (a-ITZO), field effect transistors (FETs), electrical performance, bias stability, oxygen diffusion