Hong Zhang

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Proton Irradiation Induced Single-Event Burnout Effect in P-Gan Power Devices

Number of pages: 12 Posted: 03 Jun 2024

Ruxue Bai, Hongxia Guo, Hong Zhang, Feng Qi Zhang, Wu Ying, Xiaoping Ouyang and Xiang Li Zhong

affiliation not provided to SSRN, Northwest Institute of Nuclear Technology, affiliation not provided to SSRN, Northwest Institute of Nuclear Technology, Northwest Institute of Nuclear Technology, Xiangtan University and affiliation not provided to SSRN

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