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Wu Ying

Northwest Institute of Nuclear Technology

China

  • Northwest Institute of Nuclear Technology

SCHOLARLY PAPERS

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Scholarly Papers (1)

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Proton Irradiation Induced Single-Event Burnout Effect in P-Gan Power Devices

Number of pages: 12 Posted: 03 Jun 2024
Ruxue Bai, Hongxia Guo, Hong Zhang, Feng Qi Zhang, Wu Ying, Xiaoping Ouyang and Xiang Li Zhong
affiliation not provided to SSRN, Northwest Institute of Nuclear Technology, affiliation not provided to SSRN, Northwest Institute of Nuclear Technology, Northwest Institute of Nuclear Technology, Xiangtan University and affiliation not provided to SSRN
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Abstract:

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P-gate GaN power device, Proton irradiation, Single-event burnout, Monte Carlo and TCAD simulation, Charge transport and deposition