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Yanjun Wang

University of Science and Technology of China (USTC)

No. 96 Jinzhai Road

Hefei, 230026

China

SCHOLARLY PAPERS

1

DOWNLOADS

22

TOTAL CITATIONS

0

Scholarly Papers (1)

1.

Elimination of Oisf in Large-Size Si Substrate for Low Warpage and Crack-Free Gan Epitaxial Wafer

Number of pages: 12 Posted: 09 Aug 2024
University of Science and Technology of China (USTC), affiliation not provided to SSRN, Chinese Academy of Sciences (CAS), affiliation not provided to SSRN and Chinese Academy of Sciences (CAS)
Downloads 22 (1,436,435)

Abstract:

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oxygen induced stacking fault, warpage, crack, GaN, rapid thermal annealing