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Seung-Yeong Lee

affiliation not provided to SSRN

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Scholarly Papers (1)

1.

Prediction of Fatigue Life of Semiconductor Package Under Thermal Cycling: Combined Effect of Package Design and Solder Materials

Number of pages: 34 Posted: 14 Feb 2025
Hanyang University, Hanyang University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Hanyang University
Downloads 41 (1,183,237)
Citation 1

Abstract:

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Solder, Copper, Reliability, Crack type, Fatigue life, Thermal cycling