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Kwangkyo Jung

Kwangwoon University

Seoul 139-701

Korea, Republic of (South Korea)

  • Kwangwoon University

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Scholarly Papers (1)

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Enhanced Reliability of HfO2-based Conductive Bridge Random Access Memory through MgO Insertion

Number of pages: 22 Posted: 11 Oct 2025
Si-Yeol Lee, Seung-Hwan Kim, In-Kook Hwang, Kwangkyo Jung, Hyun-Yong Yu, Hamin Park and Seung-heon Chris Baek
affiliation not provided to SSRN, Korea Institute of Science and Technology (KIST), affiliation not provided to SSRN, Kwangwoon University, Korea University, Kwangwoon University and affiliation not provided to SSRN
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Abstract:

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conductive bridge random access memory, oxygen vacancy, ionic bond, magnesium oxide