Author Page for Minwoo Kim

Minwoo Kim

Ajou University

Woncheon-dong, Yeongtong-gu

Suwon-si, Gyeonggi-do

Korea, Republic of (South Korea)

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Correlation of Spectroscopically Resolved Interface and Bulk Defects to Electrical Properties in Ultrathin HfAlO MOS Capacitors

Number of pages: 31 Posted: 22 Nov 2025

Minwoo Kim, Hyunmin Dang, Seunghyun Kim, Minsoo Kim, Joonyoung Choi, Donhwan Lee, Hangyeol Lee, Sungwon Kim, Yusin Yang and Hyungtak Seo

Ajou University, Ajou University, Ajou University, Ajou University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Ajou University - Department of Materials Science & Engineering

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Minwoo Kim

Ajou University

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Scholarly Papers (1)

Correlation of Spectroscopically Resolved Interface and Bulk Defects to Electrical Properties in Ultrathin HfAlO MOS Capacitors

Abstract: