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Yusin Yang

affiliation not provided to SSRN

  • affiliation not provided to SSRN

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Scholarly Papers (1)

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Correlation of Spectroscopically Resolved Interface and Bulk Defects to Electrical Properties in Ultrathin HfAlO MOS Capacitors

Number of pages: 31 Posted: 22 Nov 2025
Minwoo Kim, Hyunmin Dang, Seunghyun Kim, Minsoo Kim, Joonyoung Choi, Donhwan Lee, Hangyeol Lee, Sungwon Kim, Yusin Yang and Hyungtak Seo
Ajou University, Ajou University, Ajou University, Ajou University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Ajou University - Department of Materials Science & Engineering
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High-k dielectric, Hafnium aluminum oxide (HfAlO), Trap, Band alignment, Spectroscopic characterization