Enhanced Breakdown Strength of Epoxy Composites by Constructing Dual-Interface Charge Barriers at the Micron Filler/Epoxy Matrix Interface

26 Pages Posted: 21 Mar 2024

See all articles by Xiaoqing Liu

Xiaoqing Liu

affiliation not provided to SSRN

Kerong Yang

affiliation not provided to SSRN

Yushun Zhao

Hefei University of Technology

Abstract

For the advanced energy systems with ultra-high voltage and frequency, in order to improve the thermal conductivity, arc resistance and mechanical strength of epoxy-based dielectric materials, the addition of micron inorganic fillers is necessary. However, this will inevitably degrade their breakdown strength. In this work, the example of constructing dual-interface charge barriers by optimizing molecular structure at micron filler/epoxy matrix interface to capture charge and then enhance the breakdown strength of epoxy composites is reported. Results show that the Al2O3@PVDF-6/BPA system with optimized interfacial structure exhibits the breakdown strength of AC and DC voltages of 37.5 and 67.8 kV/mm, respectively, far outperforming current epoxy composites containing micron fillers. The charge trapping effects in the dual-interface charge barriers are comprehensively investigated, which is confirmed to be the reason for the improved breakdown strength. In particular, the construction of dual-interface charge barriers hardly sacrifices the thermal and mechanical properties of epoxy composites. This work unveils a scalable approach to exploring satisfied dielectric epoxy composites by dual-interface charge barriers construction at the micron filler/epoxy matrix interface.

Keywords: Epoxy-based dielectric materials, Breakdown strength, Dual-interface charge barriers, Charge traps

Suggested Citation

Liu, Xiaoqing and Yang, Kerong and Zhao, Yushun, Enhanced Breakdown Strength of Epoxy Composites by Constructing Dual-Interface Charge Barriers at the Micron Filler/Epoxy Matrix Interface. Available at SSRN: https://ssrn.com/abstract=4767118 or http://dx.doi.org/10.2139/ssrn.4767118

Xiaoqing Liu (Contact Author)

affiliation not provided to SSRN ( email )

Kerong Yang

affiliation not provided to SSRN ( email )

Yushun Zhao

Hefei University of Technology ( email )

193 Tunxi Rd
Baohe
Hefei
China

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