Application of Digital Image Correlation for In-Situ Deformation Studies Using Transmission Electron Microscopy

Abstract

Digital Image correlation (DIC) is routinely applied using optical and scanning electron microscopy methods to map local strains during deformation. In this letter, we report its use for in-situ TEM imaged deformation of a nanocrystalline metal. Since transmitted electrons give rise to complex contrast conditions, with such contrast associated with the mechanisms of deformation, one can track these changes if particular care is done in image analysis and interpretation. We describe these methodologies to enable this correlation through frame averaging making it suitable for this methodology. Using these collective correlation conditions, we found that the average DIC strain matches well with the far field strain values yielding increased confidence in its application. Finally, through the utilization of DIC in the TEM, nanoscale deformation mechanisms can be elucidated because of the increased spatial resolution offered by TEM.

Keywords: Digital image correlation, Nanocrystalline, in situ deformation, Transmission electron microscopy