affiliation not provided to SSRN
aluminium nitride (AlN), atomic force microscopy (AFM), piezoresponce force microscopy (PFM), piezoelectricity, Raman spectroscopy.
Aluminum nitride, RF magnetron sputtering, piezoelectric response, Piezoresponse Force Microscopy (PFM), Kelvin Probe Force Microscopy (KPFM), surface potential