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Junkang Wang

affiliation not provided to SSRN

  • affiliation not provided to SSRN

SCHOLARLY PAPERS

4

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237

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0

Scholarly Papers (4)

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1.

Maskless Patterned Plasma Fabrication of Interdigitated Back Contact Silicon Heterojunction Solar Cells: Characterization and Optimization

Number of pages: 17 Posted: 11 Mar 2023
Junkang Wang, Monalisa Ghosh, Karim Ouaras, Dmitri Daineka, Pavel Bulkin, Pere Roca i Cabarrocas, Sergej Filonovich, José Alvarez and Erik Johnson
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Institut Polytechnique de Paris - Le Laboratoire de physique des interfaces et couches minces (LPICM), TotalEnergies SE, CentraleSupélec and affiliation not provided to SSRN
Downloads 82 (790,029)

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IBC-HJT, PECVD, crystalline silicon, patterned plasma etching

2.

Maskless Interdigitated A-Si:H Pecvd Process on Full M0 C-Si Wafer: Homogeneity and Passivation Assessment

Number of pages: 10 Posted: 21 Apr 2022
Karim Ouaras, Sergej Filonovich, Bastien Bruneau, Junkang Wang, Monalisa Ghosh and Erik Johnson
affiliation not provided to SSRN, TotalEnergies SE, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
Downloads 60 (970,490)

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Plasma patterning, passivation, amorphous silicon, IBC solar cell

3.

Investigation of Patterned Etching Processes for Hjt-Ibc Solar Cells: Keys to Maintaining a High Electronic Quality Surface

Number of pages: 17 Posted: 31 Jan 2025
Junkang Wang, Chandralina Patra, Weixi Wang, Monalisa Ghosh, Pavel Bulkin, Dmitri Daineka, Kassiogé Dembélé, Pere Roca i Cabarrocas, Karim Ouaras, Sergej Filonovich, Mathieu Frengnaux, Muriel Bouttemy and Erik Johnson
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Institut Polytechnique de Paris - Le Laboratoire de physique des interfaces et couches minces (LPICM), affiliation not provided to SSRN, TotalEnergies SE, affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
Downloads 57 (1,000,027)

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HJT-IBC, Patterned plasma etching, H2 plasma cleaning, XPS, HRTEM

4.

Why is there an optimal thickness for doped nanocrystalline silicon layers in heterojunction solar cells, and how can it be predicted?

Downloads 38 (1,304,549)

Why is there an optimal thickness for doped nanocrystalline silicon layers in heterojunction solar cells, and how can it be predicted?

Number of pages: 16 Posted: 09 Feb 2026
Chandralina Patra, Junkang Wang, Kassiogé Dembélé, Pavel Bulkin, Alexandre Blaizot, Pere Roca i Cabarrocas and Erik Johnson
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Institut Polytechnique de Paris - Le Laboratoire de physique des interfaces et couches minces (LPICM) and affiliation not provided to SSRN
Downloads 20 (1,513,226)

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Silicon heterojunction solar cells, Doped nanocrytalline silicon, Film continuity, Open circuit voltage, Cross-sectional TEM, Ellipsometry

Why is there an optimal thickness for doped nanocrystalline silicon layers in heterojunction solar cells, and how can it be predicted?

Number of pages: 16 Posted: 11 Feb 2026
Chandralina Patra, Junkang Wang, Kassiogé Dembélé, Pavel Bulkin, Alexandre Blaizot, Pere Roca i Cabarrocas and Erik Johnson
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Institut Polytechnique de Paris - Le Laboratoire de physique des interfaces et couches minces (LPICM) and affiliation not provided to SSRN
Downloads 18 (1,589,301)

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Silicon heterojunction solar cells, Doped nanocrytalline silicon, Film continuity, Open circuit voltage, Cross-sectional TEM, Ellipsometry