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Yuan Qin

Virginia Tech

Blacksburg, VA

United States

SCHOLARLY PAPERS

1

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147

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0

Scholarly Papers (1)

1.

Investigation of Deep Defects and Their Effects on the Properties of NiO/Β- Ga2O3 Heterojuncion Diodes

Number of pages: 36 Posted: 11 Oct 2022
University of Nottingham, University of Biskra, University of Biskra, Jouf University, University of Nottingham, University of Nottingham, University of Nottingham, University of Nottingham, University of Nottingham, Universidade Federal de São Carlos (UFScar), Universidade Federal de São Carlos (UFScar), Universidade Federal de São Carlos (UFScar), University of São Paulo (USP), University of São Paulo (USP), Xidian University, Virginia Tech, Virginia Tech, Virginia Tech and Virginia Tech
Downloads 147 (502,974)

Abstract:

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NiO/β-Ga2O3 heterojunction diodes, deep level transient spectroscopy, photoluminescence, Raman, electrical characteristics, modeling