Jhongli, Taoyuan 32001, Taiwan.
Jhongli, 32001
Taiwan
National Central University
Photoinduced Froce Microscopy, Infrared nanoscopy, Silicon Carbide, Surface Phonon Polariton, Contamination layer
graphene, Anti-oxidation, ARPES, XPS, Raman Spectroscopy
graphene, Anti-oxidation, ARPES, XPS, Raman spectroscopy
near field optics, photo-induced force microscopy, near-field scanning optical microscopy, metal-insulator-metal metasurfaces, nanophotonics
Boron, Germanium, Hydrogen, Carbon, Implantation