affiliation not provided to SSRN
Photoinduced Froce Microscopy, Infrared nanoscopy, Silicon Carbide, Surface Phonon Polariton, Contamination layer
near field optics, photo-induced force microscopy, near-field scanning optical microscopy, metal-insulator-metal metasurfaces, nanophotonics
silicon carbide, temperature dependence of physical properties, anisotropy of physical properties, phonon-plasmon coupling