Sydney, 2052
Australia
University of New South Wales (UNSW)
TOPCon, UV-induced degradation (UVID), Surface passivation, Hydrogen dynamics, Charge trapping, reliability
Silicon heterojunction solar cells, damp heat, failure mode, humidity-induced degradation, ethylene vinyl acetate, glass-backsheet modules
UV-induced degradation, TOPCon cells, interface defects density, negative fixed charge, capture cross sections
Recombination, Surface Passivation, Degradation, HJT solar cells, Defects, Silicon