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Ruirui Lv

Canadian Solar Inc.

Human Resource Department

199 Lushan Rd. SND,

Suzhou,, 215129

China

SCHOLARLY PAPERS

1

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0

Scholarly Papers (1)

1.

Charge Trapping, Hydrogen Accumulation, and Structural Rearrangement: A Complete Model for Ultraviolet-Induced Degradation in TOPCon Devices

Number of pages: 10 Posted: 15 Oct 2025
University of New South Wales (UNSW), affiliation not provided to SSRN, affiliation not provided to SSRN, University of New South Wales (UNSW), Canadian Solar Inc., Canadian Solar Inc., Canadian Solar Inc., Canadian Solar Inc., Canadian Solar Inc., University of New South Wales (UNSW), University of New South Wales (UNSW), affiliation not provided to SSRN and University of New South Wales (UNSW)
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Abstract:

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TOPCon, UV-induced degradation (UVID), Surface passivation, Hydrogen dynamics, Charge trapping, reliability