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Aeron Johns

affiliation not provided to SSRN

  • affiliation not provided to SSRN

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Charge Trapping, Hydrogen Accumulation, and Structural Rearrangement: A Complete Model for Ultraviolet-Induced Degradation in TOPCon Devices

Number of pages: 10 Posted: 15 Oct 2025
Muhammad Umair Khan, Alison Ciesla, Aeron Johns, Chandany Sen, Ting Huang, Hao Song, Munan Gao, Ruirui Lv, Yuanjie Yu, Xinyuan Wu, Haoran Wang, Xutao Wang and Bram Hoex
University of New South Wales (UNSW), affiliation not provided to SSRN, affiliation not provided to SSRN, University of New South Wales (UNSW), Canadian Solar Inc., Canadian Solar Inc., Canadian Solar Inc., Canadian Solar Inc., Canadian Solar Inc., University of New South Wales (UNSW), University of New South Wales (UNSW), affiliation not provided to SSRN and University of New South Wales (UNSW)
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Abstract:

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TOPCon, UV-induced degradation (UVID), Surface passivation, Hydrogen dynamics, Charge trapping, reliability