Plaça Cívica
Cerdañola del Valles
Barcelona, 08193
Spain
Autonomous University of Barcelona
breakdown voltage, dry etching, HfO2, memristor, Resistive Switching, W, wet etching
dielectric breakdown, oxide breakdown, MOS, MIM, oxide reliability, clustering, weibull
dielectric breakdown, oxide breakdown, MOS, MIM, oxide reliability
Memristor, Resistive Switching, crosspoint array, SPICE, LTspice