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Karla Hiller

Chemnitz University of Technology

09107

SCHOLARLY PAPERS

1

DOWNLOADS

42

TOTAL CITATIONS

0

Scholarly Papers (1)

1.

Characterization of Plasma-Activated, Thermally-Annealed Si-Sio2 Direct Bond Strength for Vapor Hf Etching

Number of pages: 7 Posted: 28 Jun 2023
Tohoku University, Tohoku University, Chemnitz University of Technology and Tohoku University
Downloads 42 (1,170,409)

Abstract:

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Silicon direct bonding, bond strength, vapor HF etching, thermal annealing, plasma activation