default author photo

Sin-Hyung Lee

Kyungpook National University

Korea, Republic of (South Korea)

  • Kyungpook National University

SCHOLARLY PAPERS

2

DOWNLOADS

84

TOTAL CITATIONS

4

Scholarly Papers (2)

Actions:
Email selected abstracts
1.

Atomically Thin Amorphous Oxide Semiconductor Film Using a Solution Process for High-Performance Oxide Transistors

Number of pages: 23 Posted: 14 Jul 2023
Jun-Hyeong Park, Won Park, Jeong-Hyeon Na, Jinuk Lee, Jun-Su Eun, Junhao Feng, Xue Zhang, Jaehoon Park, Sin-Hyung Lee, Jaewon Jang, In Man Kang, Do-Kyung Kim and Jin-Hyuk Bae
Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Shandong University of Science and Technology, Hallym University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University and Kyungpook National University
Downloads 55 (1,031,043)
Citation 4

Abstract:

Loading...

Amorphous oxide semiconductor, thin-film transistors, ultrathin channel, high performance, solution process

2.

Dependence of Positive Bias Stress Instability on Threshold Voltage and its Origin in Solution-Processed Aluminum-Doped Indium Oxide Thin-Film Transistors

Number of pages: 21 Posted: 28 Nov 2023
Jeong-Hyeon Na, Jun-Hyeong Park, Won Park, Junhao Feng, Jun-Su Eun, Jinuk Lee, Sin-Hyung Lee, Jaewon Jang, In Man Kang, Do-Kyung Kim and Jin-Hyuk Bae
Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University and Kyungpook National University
Downloads 29 (1,332,057)

Abstract:

Loading...

Oxide semiconductor, Thin-film transistors (TFTs), Bias instability, Threshold voltage dependency, Aluminum doping, Degradation mechanism