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Jaewon Jang

Kyungpook National University

Korea, Republic of (South Korea)

  • Kyungpook National University

SCHOLARLY PAPERS

5

DOWNLOADS

254

TOTAL CITATIONS

4

Scholarly Papers (5)

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1.

Chloride-Based Combustion Synthesis for Enhanced Carrier Transport of Sol-Gel Processed Sno2 Thin-Film Transistors with Schottky Contacts

Number of pages: 37 Posted: 23 Mar 2022
Bongho Jang, Junhee Lee, Hongki Kang, Jaewon Jang and Hyuk-Jun Kwon
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Kyungpook National University and affiliation not provided to SSRN
Downloads 66 (907,769)

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SnO2, Combustion, Sol-gel, Schottky contact, Thin-film transistors

2.

Conductivity-Tailored Thermal Crystallization of Ultrathin Indium Oxide Enabled by a Yttrium Oxide Capping Layer for High-Bias-Stress-Robust Enhancement-Mode Transistors

Number of pages: 33 Posted: 12 Nov 2025
Jin-Hyuk Bae, Se Jin Park, Jinhong Park, Dohyeon Gil, Jae Wook Ahn, Minsu Choi, Jaewon Jang, Jangwoo Kim, Hyun Sung Park, Young-Gu Kang, HyeonDo Park and Do-Kyung Kim
Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Kangwon National University
Downloads 61 (970,490)

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Metal-oxides, Thin-film transistors, Thermal crystallization, reliability, Capping layer, Bias stress stability

3.

Atomically Thin Amorphous Oxide Semiconductor Film Using a Solution Process for High-Performance Oxide Transistors

Number of pages: 23 Posted: 14 Jul 2023
Jun-Hyeong Park, Won Park, Jeong-Hyeon Na, Jinuk Lee, Jun-Su Eun, Junhao Feng, Xue Zhang, Jaehoon Park, Sin-Hyung Lee, Jaewon Jang, In Man Kang, Do-Kyung Kim and Jin-Hyuk Bae
Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Shandong University of Science and Technology, Hallym University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University and Kyungpook National University
Downloads 55 (1,031,043)
Citation 4

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Amorphous oxide semiconductor, thin-film transistors, ultrathin channel, high performance, solution process

4.

Unveiling Chemical and Physical Bulk Defects in Ultrathin Indium Oxide Transistors with Yttrium Oxide Capping via Nanoscale Channel Thickness Modulation

Number of pages: 38 Posted: 11 Oct 2025
Dohyeon Gil, Se Jin Park, Jinhong Park, Jae Wook Ahn, Minsu Choi, Jaewon Jang, Honghwi Park, Jaehoon Park, Xue Zhang, Jin-Hyuk Bae and Do-Kyung Kim
Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, affiliation not provided to SSRN, Hallym University, Shandong University of Science and Technology, Kyungpook National University and Kangwon National University
Downloads 43 (1,209,354)

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Thin-film transistors, ultrathin indium oxide, bulk defects, channel thickness, positive bias instability

5.

Dependence of Positive Bias Stress Instability on Threshold Voltage and its Origin in Solution-Processed Aluminum-Doped Indium Oxide Thin-Film Transistors

Number of pages: 21 Posted: 28 Nov 2023
Jeong-Hyeon Na, Jun-Hyeong Park, Won Park, Junhao Feng, Jun-Su Eun, Jinuk Lee, Sin-Hyung Lee, Jaewon Jang, In Man Kang, Do-Kyung Kim and Jin-Hyuk Bae
Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University and Kyungpook National University
Downloads 29 (1,332,057)

Abstract:

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Oxide semiconductor, Thin-film transistors (TFTs), Bias instability, Threshold voltage dependency, Aluminum doping, Degradation mechanism