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Jangwoo Kim

affiliation not provided to SSRN

  • affiliation not provided to SSRN

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Conductivity-Tailored Thermal Crystallization of Ultrathin Indium Oxide Enabled by a Yttrium Oxide Capping Layer for High-Bias-Stress-Robust Enhancement-Mode Transistors

Number of pages: 33 Posted: 12 Nov 2025
Jin-Hyuk Bae, Se Jin Park, Jinhong Park, Dohyeon Gil, Jae Wook Ahn, Minsu Choi, Jaewon Jang, Jangwoo Kim, Hyun Sung Park, Young-Gu Kang, HyeonDo Park and Do-Kyung Kim
Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Kangwon National University
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Metal-oxides, Thin-film transistors, Thermal crystallization, reliability, Capping layer, Bias stress stability