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Do-Kyung Kim

Kangwon National University

Chunchon

Korea, Republic of (South Korea)

  • Kangwon National University

SCHOLARLY PAPERS

2

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107

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Scholarly Papers (2)

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1.

Conductivity-Tailored Thermal Crystallization of Ultrathin Indium Oxide Enabled by a Yttrium Oxide Capping Layer for High-Bias-Stress-Robust Enhancement-Mode Transistors

Number of pages: 33 Posted: 12 Nov 2025
Jin-Hyuk Bae, Se Jin Park, Jinhong Park, Dohyeon Gil, Jae Wook Ahn, Minsu Choi, Jaewon Jang, Jangwoo Kim, Hyun Sung Park, Young-Gu Kang, HyeonDo Park and Do-Kyung Kim
Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Kangwon National University
Downloads 62 (970,490)

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Metal-oxides, Thin-film transistors, Thermal crystallization, reliability, Capping layer, Bias stress stability

2.

Unveiling Chemical and Physical Bulk Defects in Ultrathin Indium Oxide Transistors with Yttrium Oxide Capping via Nanoscale Channel Thickness Modulation

Number of pages: 38 Posted: 11 Oct 2025
Dohyeon Gil, Se Jin Park, Jinhong Park, Jae Wook Ahn, Minsu Choi, Jaewon Jang, Honghwi Park, Jaehoon Park, Xue Zhang, Jin-Hyuk Bae and Do-Kyung Kim
Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, Kyungpook National University, affiliation not provided to SSRN, Hallym University, Shandong University of Science and Technology, Kyungpook National University and Kangwon National University
Downloads 45 (1,209,354)

Abstract:

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Thin-film transistors, ultrathin indium oxide, bulk defects, channel thickness, positive bias instability