Yoon-Seo Kim

Hanyang University

Seoul

Korea, Republic of (South Korea)

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Reliability Engineering of High-Mobility Igzo Transistors Via Gate Insulator Heterostructures Grown by Atomic Layer Deposition

Number of pages: 29 Posted: 05 Dec 2023

Yoon-Seo Kim, Taewon Hwang, Hye-Jin Oh, Joon Seok Park and Jin-Seong Park

Hanyang University, Hanyang University, Hanyang University, affiliation not provided to SSRN and Hanyang University

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