affiliation not provided to SSRN
adhesion, BEOL, surface treatment, Dielectric constant, Deposition sequence, Adhesion mapping
mechanical reliability, interfacial adhesion, surface treatments, crystallographic orientations, alternating crack path, semiconductor device
loading mode, crack path, adhesion, surface treatment, fracture test method
Solder oxide layer, Diffusion barrier, Head-in-Pillow defect, High-selectivity chemical etching, Reliability