Young-Min Ju

Hanyang University

Seoul

Korea, Republic of (South Korea)

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Measurement of Interfacial Adhesion Strength of Copper-Silicon Based Dielectric Interfaces Via Laser Spallation Test

Number of pages: 18 Posted: 03 Apr 2025

Young-Min Ju, Dukyong Kim, Se-Min Lee, Heuisu Kim, Daewoong Lee, Yeon-Taek Hwang, Seung Hwan Lee and Hak-Sung Kim

Hanyang University, Hanyang University, Hanyang University, Hanyang University, SK hynix Inc, SK hynix Inc, Hanyang University and Hanyang University

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