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Albert Crespo-Yepes

Autonomous University of Barcelona

Barcelona

Spain

  • Autonomous University of Barcelona

SCHOLARLY PAPERS

2

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38

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0

Scholarly Papers (2)

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1.

On the Role of Power Dissipation in the Post-Bd Behavior of Fdsoi Nanowire Fets

Number of pages: 4 Posted: 13 Jun 2025
Rishab Goyal, Albert Crespo-Yepes, Marc Porti Pujal, R. Rodriguez and Montserrat Nafria
affiliation not provided to SSRN, Autonomous University of Barcelona, Autonomous University of Barcelona, Autonomous University of Barcelona and Autonomous University of Barcelona
Downloads 20 (1,448,301)

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Aging, FDSOI, nanowire, high-k, reliability, Dielectric Breakdown.

2.

A Statistical Characterization of Dielectric Breakdown in Fdsoi Nanowire Transistors

Number of pages: 7 Posted: 11 Aug 2025
Rishab Goyal, Albert Crespo-Yepes, Marc Porti Pujal, R. Rodriguez and Montserrat Nafria
affiliation not provided to SSRN, Autonomous University of Barcelona, Autonomous University of Barcelona, Autonomous University of Barcelona and Autonomous University of Barcelona
Downloads 18 (1,481,165)

Abstract:

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Failure, Dielectric Breakdown, FD-SOI, NW FETs, high-k, reliability, power consumption, lifetime.