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Marc Porti Pujal

Autonomous University of Barcelona

  • Autonomous University of Barcelona

SCHOLARLY PAPERS

3

DOWNLOADS

102

TOTAL CITATIONS

0

Scholarly Papers (3)

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1.

Comprehensive Statistical Analysis of Random Telegraph Noise: Impact of Gate Voltage, Temperature, and Bias Time

Number of pages: 6 Posted: 11 Aug 2025
Javier Martin-Martinez, Nazanin Baghban-Bousari, Rafael Castro-Lopez, Deborah Eric, Elisenda Roca, R. Rodriguez, Marc Porti Pujal, Francisco Vidal Fernandez and Montserrat Nafria
Autonomous University of Barcelona, Autonomous University of Barcelona, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Autonomous University of Barcelona, Autonomous University of Barcelona, affiliation not provided to SSRN and Autonomous University of Barcelona
Downloads 63 (951,658)

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Random Telegraph NoiseReliabilityCMOS devicesstatistical analysis

2.

On the Role of Power Dissipation in the Post-Bd Behavior of Fdsoi Nanowire Fets

Number of pages: 4 Posted: 13 Jun 2025
Rishab Goyal, Albert Crespo-Yepes, Marc Porti Pujal, R. Rodriguez and Montserrat Nafria
affiliation not provided to SSRN, Autonomous University of Barcelona, Autonomous University of Barcelona, Autonomous University of Barcelona and Autonomous University of Barcelona
Downloads 21 (1,448,301)

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Aging, FDSOI, nanowire, high-k, reliability, Dielectric Breakdown.

3.

A Statistical Characterization of Dielectric Breakdown in Fdsoi Nanowire Transistors

Number of pages: 7 Posted: 11 Aug 2025
Rishab Goyal, Albert Crespo-Yepes, Marc Porti Pujal, R. Rodriguez and Montserrat Nafria
affiliation not provided to SSRN, Autonomous University of Barcelona, Autonomous University of Barcelona, Autonomous University of Barcelona and Autonomous University of Barcelona
Downloads 18 (1,481,165)

Abstract:

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Failure, Dielectric Breakdown, FD-SOI, NW FETs, high-k, reliability, power consumption, lifetime.