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Yu Yang

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Sic Trench Igbt with N-Barrier Layer to Enhance Conductivity Modulation

Number of pages: 12 Posted: 06 Aug 2025
Ruixue Mai, Xiaoli Tian, Yu Yang, Wei wei, Chengzhan Li, Yun Bai, Chengyue Yang, Kaikai Wang and Yidan Tang
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
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silicon carbide, IGBT, forward voltage drop, switching loss, reliability