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Zhengqian Lu

affiliation not provided to SSRN

  • affiliation not provided to SSRN

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Effect of Ti Contact Layer Thickness and Annealing on Ohmic Contacts to N-Face Fe-doped Semi-Insulating GaN

Number of pages: 8 Posted: 09 Oct 2025
Yuanhang Sun, Hao Zhou, Xinyu Hao, Zhengqian Lu, Yuning Wang, Jue-Min Yi, Yumin Zhang, Jianfeng Wang and Ke Xu
affiliation not provided to SSRN, Soochow University, affiliation not provided to SSRN, affiliation not provided to SSRN, Chinese Academy of Sciences (CAS), affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Chinese Academy of Sciences (CAS)
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gallium nitride (GaN), semi-insulating, N-face, ohmic contact, Ti Contact Layer, Annealing